Study on threshold voltage shifts and reliability in PFETs by high-voltage on-state and off-state stress

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2013

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viii, 88 p. : ill. (some col.) ; 30 cm.

General Note:

Supervisor : Prof. Toshiro Hiramoto

Also available in CD-ROM : CP 052928 ra

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Thesis (Ph.D (Electrical Engineering and Information Systems)) - University of Tokyo, 2014

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