Title:
Caracterisation de structures mos submicroniques et analyse de defauts induits par irradiation gamma : extrapolation aux defauts induits dans les oxydes transistors bipolaires
Personal Author:
Publication Information:
France : Universite de Metz, 1999
General Note:
Text in French
DSP_DISSERTATION:
Thesis (Phd. Electronic )- Univrsite de Metz, 1999
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
|---|---|---|---|---|---|
Searching... | 30000010016543 | TK7871.99M44 H39 1999 | Closed Access Thesis | UTM PhD Thesis (Closed Access) | Searching... |
