Cover image for Optical properties measurements of nanocrystalline silicon thin films
Title:
Optical properties measurements of nanocrystalline silicon thin films
Personal Author:
Gan, Chee Hong, 1986-
Publication Information:
2011
Physical Description:
xiii, 69 p. : ill. ; 30 cm.
General Note:
Supervisor : Prof. Dr. Samsudi Sakrani

Also available in CD-ROM : CP 028736 ra
Subject Term:
Thin films -- Optical properties

Nanostructured materials
Added Author:
Samsudi Sakrani,
Added Corporate Author:
Fakulti Sains
DSP_DISSERTATION:
Thesis (Sarjana Sains (Fizik)) - Universiti Teknologi Malaysia, 2011

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 FS300000005956 QC176.84.O7 G36 raf Closed Access Thesis UTM Master Thesis (Open Shelves)
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 30000010291054 QC176.84.O7 G36 2011 raf Closed Access Thesis UTM Master Thesis (Closed Access)
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