Cover image for Development of automatic test pattern generation
Title:
Development of automatic test pattern generation
Physical Description:
axiii, 66 pages : illustrations (some colors) ; 30 cm
General Note:
Supervisor : Dr. Norlina Paraman
Added Author:
Added Corporate Author:
DSP_DISSERTATION:
Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2017

Available:*

Library
Item Barcode
Call Number
Material Type
Item Category 1
Status
Searching...
32030000002119 TK7874.55 T36 2017 raf Closed Access Thesis UTM Project Paper (Open Shelves)
Searching...
Searching...
35000000008968 TK7874.55 T36 2017 raf Closed Access Thesis UTM Project Paper (Closed Access)
Searching...

On Order