Title:
Test pattern generation for path delay fault using stuck-at fault automatic test pattern generator
Personal Author:
Publication Information:
2010
Physical Description:
xvi, 100 p. : ill. ; 30 cm.
General Note:
Supervisor : Dr Ooi Chia Yee
Subject Term:
Added Author:
Added Corporate Author:
DSP_DISSERTATION:
Project Paper (Sarjana Muda Kejuruteraan (Komputer)) - Universiti Teknologi Malaysia, 2010
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
|---|---|---|---|---|---|
Searching... | FKE30000004982 | XX(764262.2) | Closed Access Thesis | UTM Project Paper (Closed Access) | Searching... |
Searching... | 30000010256673 | TK7874 N434 2010 raf | Closed Access Thesis | UTM Project Paper (Closed Access) | Searching... |
