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Cover image for System-on-chip (SoC) testing using adhoc high-level design for-testability method
Title:
System-on-chip (SoC) testing using adhoc high-level design for-testability method
Personal Author:
Publication Information:
2009
Physical Description:
xiii, 71 p. : ill. ; 30 cm.
General Note:
Supervisor : Dr. Ooi Chia Yee

Also available in CD-ROM : CP 019731 ra
Added Author:
Added Corporate Author:
DSP_DISSERTATION:
Thesis (Sarjana Kejuruteraan (Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2009

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FKE30000002520 TK7895.E42 C43 2009 raf Closed Access Thesis UTM Master Thesis (Closed Access)
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30000010232698 TK7895.E42 C43 2009 raf Closed Access Thesis UTM Master Thesis (Closed Access)
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