Cover image for Yield and reliability in microwave circuit and system design
Title:
Yield and reliability in microwave circuit and system design
Personal Author:
Meehan, Michael D.
Publication Information:
Boston : Artech House, 1993
ISBN:
9780890065273
Subject Term:
Microwave integrated circuits -- Design and construction -- Statistical methods

Engineering design -- Statistical methods

Computer-aided design
Added Author:
Purviance, John

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 30000002860157 TK7876.M43 1993 Open Access Book Book
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