Title:
X-ray diffraction studies on silicon nanostructure thin films : (review paper)
Personal Author:
Series:
Siri kertas kerja penyelidikan (Universiti Teknologi Malaysia. Pusat Pengurusan Penyelidikan)
Publication Information:
Skudai : Universiti Teknologi Malaysia, 2005
Physical Description:
[7] p. : ill. ; 29 cm.
General Note:
Vot 74543
Subject Term:
Added Conference Author:
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
---|---|---|---|---|---|
Searching... | 30000010071771 | QC482.D5 Y87 2005 | Non Circulating UTM Special Collection Materials | 1:BOOK_ARC | Searching... |
Searching... | 30000010071772 | QC482.D5 Y87 2005 | Open Access Book | Proceedings, Conference, Workshop etc. | Searching... |
Searching... | 30000010071773 | QC482.D5 Y87 2005 | Open Access Book | Book | Searching... |