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Cover image for Design built-in-self-test for ALU using scan cell approach
Title:
Design built-in-self-test for ALU using scan cell approach
Personal Author:
Publication Information:
2002
Physical Description:
xviii, 221p. : ill. ; 30 cm.
General Note:
Supervisor : Assoc. Prof. Dr. Abu Khari A'anin
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Added Corporate Author:
DSP_DISSERTATION:
Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2002

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30000010026785 TK7895.G36 M83 2002 raf Closed Access Thesis UTM Project Paper (Closed Access)
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