Cover image for Characterization and behavior of interfaces : proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA
Title:
Characterization and behavior of interfaces : proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA
Publication Information:
Amsterdam ; Fairfax, VA : IOS Press, c2010
Physical Description:
x, 155 p. : ill. ; 25 cm.
ISBN:
9781607504900
General Note:
"The Georgia Institute of Technology hosted a one-day Research Symposium on Characterization and Behavior of Interfaces (CBI) that was held in conjunction with the Fourth International Symposium on Deformation Characteristics of Geomaterials (IS Atlanta 2008). The CBI research symposium was held on September 21, 2008."--P. vii.
Subject Term:
Engineering geology -- Congresses

Surfaces (Technology) -- Congresses
Added Author:
Frost, J. David
Added Corporate Author:
Georgia Institute of Technology

Available:*

Library
Item Barcode
Call Number
Material Type
Item Category 1
Status
Searching...
 30000010275274 TA703.5 R47 2008 Open Access Book Book
Searching...

On Order