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Towe, Elias

Author

Towe, Elias, Society of Photo-Optical Instrumentation Engineers

Format:

Call Number

TA1660 H47 2000

Publisher

SPIE Optical Engineering Press,

Publication Date

2000

ISBN

9780819435712

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International Conference on Materials and Process Characterization for VLSI (1988 : Shanghai, China)

Author

International Conference on Materials and Process Characterization for VLSI (1988 : Shanghai, China), Wang, Yangyuan, Chen, Jun, Zong, Xiangfu

Format:

Call Number

TK7874.I59 1988

Publisher

World Scientific,

Publication Date

1988

ISBN

9789971506889

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