Search Results for Materials -- Research

Select an Action

Place Hold(s)
Add to My Lists
Email
Print

2 Results Found

00MAIN

Comparison of thin film transistor and SOI technologies

Lam, H. W.

Author

Lam, H. W., Thompson, M. J.

Format:

Call Number

TK7874.C69 1984

Publisher

North-Holland,

Publication Date

1984

ISBN

9780444008992

Available:
Holds:
Copies:

Cover image for Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A.

Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A.

Symposium O, "Materials, Processes, and Reliability for Advanced Interconnects for Micro- and Nanoelectronics" (2011 : San Francisco, Calif.)

Author

Symposium O, "Materials, Processes, and Reliability for Advanced Interconnects for Micro- and Nanoelectronics" (2011 : San Francisco, Calif.), Baklanov, Mikhail R., Materials Research Society. Meeting (2011 : San Francisco, Calif.)

Format:

Call Number

TK7874.53 S965 2012

Publisher

Materials Research Society ; Cambridge University Press,

Publication Date

2012

ISBN

9781605113128

Available:
Holds:
Copies:

Select an Action

Place Hold(s)
Add to My Lists
Email
Print

	{displayName}	{count}
{error}