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Cover image for NEMS/MEMS technology and devices : selected peer reviewed papers from the International Conference on Materials for Advanced Technologies 2009, symposium L, 28 June - 3 July, Singapore
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Cover image for Properties and processes at the nanoscale : nanomechanics of material behavior : symposium held November 28-December 2, 2011, Boston, Massachusetts, U.S.A.
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Cover image for Nanoscaled semiconductor-on-insulator materials, sensors and devices : selected, peer reviewed papers from the 6th International Workshop on Semiconductor-on-Insulator Materials and Devices, 24-28 October, 2010 Kyiv, Ukraine
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