Cover image for Analog IC reliability in nanometer CMOS
Title:
Analog IC reliability in nanometer CMOS
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Series:
Analog circuits and signal processing series
Publication Information:
New York, NY. : Springer, 2013
Physical Description:
xvi, 198 p. : ill. ; 24 cm.
ISBN:
9781461461623
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30000010335716 TK7871.99.M44 M374 2013 Open Access Book Book
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