Title:
Analog IC reliability in nanometer CMOS
Personal Author:
Series:
Analog circuits and signal processing series
Publication Information:
New York, NY. : Springer, 2013
Physical Description:
xvi, 198 p. : ill. ; 24 cm.
ISBN:
9781461461623
Added Author:
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
---|---|---|---|---|---|
Searching... | 30000010335716 | TK7871.99.M44 M374 2013 | Open Access Book | Book | Searching... |