Cover image for Lock-in thermography : basics and use for evaluating electronic devices and materials
Title:
Lock-in thermography : basics and use for evaluating electronic devices and materials
Personal Author:
Series:
Springer series in advanced microelectronics ; 10
Edition:
2nd ed.
Publication Information:
Heidelberg ; New York : Springer, c2010
Physical Description:
x, 255 p. : ill. (some col.) ; 24 cm.
ISBN:
9783642024160

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30000010273817 TK7870.25 B74 2010 Open Access Book Book
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