Title:
Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale
Publication Information:
New York, NY : Springer, 2007
Physical Description:
2v.
ISBN:
9780387286679
General Note:
Available online version
Electronic Access:
FulltextAvailable:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
|---|---|---|---|---|---|
Searching... | 30000010126331 | QH212.S33 S32 2007 issue.1 | Open Access Book | Great Book | Searching... |
Searching... | 30000010126330 | QH212.S33 S32 2007 issue.2 | Open Access Book | Great Book | Searching... |
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Summary
Summary
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Table of Contents
| SPM Techniques for electrical characterization |
| Scanning Tunneling Microscopy and Tunneling Potentiometry |
| Scanning Spreading Resistance Microscopy and Scanning Potentiometry |
| Scanning Capacitance Microscopy and Nanoimpedance Microscopy |
| Scanning Gate Microscopy |
| Force-based SPM transport measurements: KPFM, EFM and SIM |
| Piezoresponse Force Microscopy |
| Ultrasonic Force Microscopy |
| Microwave Microscopy |
| Near Field Optical Microscopy |
| Electrochemical STM |
| Advanced SPM Probes for Electrical Characterization |
| Electrical and electromechanical imaging at the limits of resolution |
| Surface Metal Insulator Transitions |
| Spin polarized STM |
| STM probing of molecular transport |
| Kelvin Probe Force Microscopy of atomic systems |
| Single-electron transport in 1D systems |
| Theoretical aspects of electrical transport imaging in molecular systems |
| Friction on the atomic scale |
| Mechanics on the molecular scale |
| Electrical SPM characterization of materials and devices |
| SPM transport in semiconductors |
| SCM and KPFM of semiconductor heterostructures |
| SPM characterization of Ferroelectric Materials |
| SCM of operational devices |
| Photoinduced phenomena in semiconductor heterostructures |
| SPM characterization of III-nitrides materials |
| Advanced semiconductor metrology by SPM |
| Transport in organic electronics |
| Electrical nanofabrication |
| Direct Nanooxidation |
| Ferroelectric Lithography |
| Resist-based SPM oxidation techniques |
| Charge deposition lithography |
| Electrochemical surafec |
| Surface Modification |
