Title:
Reliability of nanoscale circuits and systems : methodologies and circuit architectures
Personal Author:
Publication Information:
New York : Springer, 2011
Physical Description:
xxvii, 195 p. : ill. (some col.) ; 25 cm.
ISBN:
9781441962164
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
---|---|---|---|---|---|
Searching... | 30000010265402 | TK145 S73 2011 | Open Access Book | Book | Searching... |