Title:
Instrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA
Series:
Proceedings of SPIE--the International Society for Optical Engineering ; v. 7042
Publication Information:
Washington : SPIE, 2008
Physical Description:
1 v. (various pagings) : ill. ; 28 cm.
ISBN:
9780819472625
Added Corporate Author:
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
|---|---|---|---|---|---|
Searching... | 30000010215762 | TA418.9.N35 I57 2008 | Open Access Book | Book | Searching... |
