Title:
Built-In-Self-Test (BIST) pattern generation for circuit under test
Personal Author:
Publication Information:
2005
Physical Description:
xiii, 120p. : ill. ; 30 cm.
General Note:
Supervisor : Ismail Ariffin
Added Author:
Added Corporate Author:
DSP_DISSERTATION:
Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Komputer)) - Universiti Teknologi Malaysia, 2005
Available:*
Library | Item Barcode | [[missing key: search.ChildField.CALLNUMBER]] | Material Type | Item Category 1 | Status |
|---|---|---|---|---|---|
Searching... | FKE30000001873 | Closed Access Thesis | UTM Project Paper (Closed Access) | Searching... | |
Searching... | 30000010097133 | TK153 N66 2005 raf | Closed Access Thesis | UTM Project Paper (Closed Access) | Searching... |
