Cover image for Handbook of optical dimensional metrology
Title:
Handbook of optical dimensional metrology
Publication Information:
FL. : Taylor & Francis, 2013.
Physical Description:
xiii, 492 p. : ill. ; 26 cm.
ISBN:
9781439854815
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30000010321112 T50 H268 2013 Open Access Book Book
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Summary

Summary

Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods.

The book first builds a foundation for evaluating optical measurement methods. It explores the many terms of optical metrology and compares it to other forms of metrology, such as mechanical gaging, highlighting the limitations and errors associated with each mode of measurement at a general level. This comparison is particularly helpful to current industry users who operate the most widely applied mechanical tools.

The book then focuses on each application area of measurement, working down from large area to medium-sized to submicron measurements. It describes the measurement of large objects on the scale of buildings, the measurement of durable manufactured goods such as aircraft engines and appliances, and the measurement of fine features on the micron and nanometer scales. In each area, the book covers fast, coarse measures as well as the finest measurements possible. Best practices and practical examples for each technology aid readers in effectively using the methods.

Requiring no prior expertise in optical dimensional metrology, this handbook helps engineers and quality specialists understand the capabilities and limitations of optical metrology methods. It also shows them how to successfully apply optical metrology to a vast array of current engineering and scientific problems.


Author Notes

Kevin Harding is a principal scientist at GE Research in Niskayuna, New York, where he leads work in optical metrology at the R&D center and provides guidance to a wide range of optical technology projects. Internationally recognized for his work in 3D measurement technology, he has received numerous honors, including the Automated Imaging Association Leadership Award and the SME Eli Whitney Productivity Award. A SPIE fellow, Harding has published over 120 technical papers, taught more than 60 short courses and tutorials, contributed sections to six books, and received over 55 patents.


Table of Contents

Kevin HardingKevin Harding and Gil AbramovichScott Sandwith and Stephen KyleVivek G. Badami and Peter J. de GrootH. Philip StahlDaniel Brown and Jean Francois LaurieQingying HuToru Yoshizawa and Lianhua JinErik Novak and Bryan GuentherJoanna SchmitKevin HardingMalgorzata Kujawinska and Michal Józwik and Adam Styk
Prefacep. vii
Editorp. xi
Contributorsp. xiii
Part I Optical Metrology: Introduction
1 Optical Metrology Overviewp. 3
2 Machine Vision for Metrologyp. 37
Part II Optical Metrology of Larger Objects
3 Laser Tracking Systemsp. 93
4 Displacement Measuring Interferometryp. 157
5 Metrology of Large Partsp. 239
Part III Optical Metrology of Medium Size Objects
6 Portable Metrologyp. 265
7 Phase-Shifting Systems and Phase-Shifting Analysisp. 287
8 Moiré Measurementp. 333
Part IV Optical Micro-Metrology of Small Objects
9 Automation in Interferometryp. 369
10 White-Light Interference 3D Microscopesp. 395
11 Focus-Based Optical Metrologyp. 419
Part V Advanced Optical Micro-Metrology Methods
12 Parallel Multifunctional System for MEMS/MOEMS and Microoptics Testingp. 451
Indexp. 481