Image processing and pattern recognition in remote sensing II : 8-9 November, 2004, Honolulu, Hawaii, USA

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Series:

SPIE proceedings series, 5657

Publication Information:

New York, NY : SPIE, 2005

Physical Description:

viii, 128 p. : ill., maps ; 28 cm.

ISBN:

9780819456182

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Library	Item Barcode	Call Number	Material Type	Item Category 1	Status
Searching... PSZ JB	30000010221530	QE33.2.R4 I53 2005	Open Access Book	Book	Searching... Unknown