Cover image for Modeling and characterization of RF and microwave power FETs
Title:
Modeling and characterization of RF and microwave power FETs
Personal Author:
Series:
The Cambridge RF and microwave engineering series
Publication Information:
Cambridge : Cambridge University Press, 2007
ISBN:
9780521870665

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30000010164665 TK7872.O7 A23 2007 Open Access Book Book
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Summary

Summary

This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.


Author Notes

John Wood is the author of several prize-winning books of poetry and photographic criticism, including the recently released Selected Poems: 1968-1998. His essays on a wide variety of subjects have appeared in many books and journals. Wood is the editor of 21st: The Journal of Contemporary Photography.

(Bowker Author Biography)