Defect-oriented testing for nano-metric CMOS VLSI circuits

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Title:

Defect-oriented testing for nano-metric CMOS VLSI circuits

Personal Author:

Series:

Frontiers in electronic testing ; 34

Edition:

2nd ed.

Publication Information:

London : Springer, 2007

ISBN:

9780387465463

General Note:

Available online version

Subject Term:

Metal oxide semiconductors, Complementary -- Testing

Metal oxide semiconductors, Complementary -- Defects

Integrated circuits -- Very large scale integration -- Testing

Integrated circuits -- Very large scale integration -- Defects

Added Author:

De Gyves, Jpse Pineda

Electronic Access:

Available:*

Library	Item Barcode	Call Number	Material Type	Item Category 1	Status
Searching... PSZ JB	30000010162747	TK7871.99.M44 S22 2007	Open Access Book	Book	Searching... Unknown

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