Cover image for IC test based on scan cell
Title:
IC test based on scan cell
Personal Author:
Publication Information:
Skudai : Universiti Teknologi Malaysia, 2001
DSP_DISSERTATION:
Thesis (Master of Electrical Engineering) - Universiti Teknologi Malaysia, 2001

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FKE30000001000 TK9966 R67 2001 Closed Access Thesis UTM Master Thesis (Closed Access)
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30000010015266 TK9966 R67 2001 Closed Access Thesis UTM Master Thesis (Closed Access)
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30000004452540 TK9966 R67 2001 Closed Access Thesis UTM Master Thesis (Closed Access)
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