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1. 
Cover image for Reliability of optical fibers and optical fiber systems : proceedings of a conference held 20-21 September 1999, Boston, Massachusetts, sponsored by SPIE--The International Society for Optical Engineering
2. 
Cover image for Instrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA
3. 
Cover image for Optical inspection and metrology for non-optics industries
4. 
Cover image for Techniques and instrumentation for detection of exoplanets IV
5. 
Cover image for Optical system alignment, tolerancing, and verification III : 2-3 August 2009, San Diego, California, United States
6. 
Cover image for Nonimaging optics : efficient design for illumination and solar concentration VI
7. 
Cover image for Novel optical systems design and optimization XII
8. 
Cover image for The nature of light : light in nature II
9. 
Cover image for Two- and three-dimensional methods for inspection and metrology VI
10. 
Cover image for Organic 3d photonics materials and devices II
11. 
Cover image for Reliability of photovoltaic cells, modules, components, and systems
12. 
Cover image for Semiconductor lasers and applications III
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