Cover image for Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
Title:
Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
Personal Author:
Publication Information:
2009
Physical Description:
xx, 142 p. : ill. ; 30 cm.
General Note:
Supervisor : Prof. Dr. Razali Ismail

Also available in CD-ROM : CP 019231 ra
Added Author:
Added Corporate Author:
DSP_DISSERTATION:
Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2009

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FKE30000002619 TK7871.99.M44 M35 2009 raf Closed Access Thesis UTM Master Thesis (Closed Access)
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30000010234768 TK7871.99.M44 M35 2009 raf Closed Access Thesis UTM Master Thesis (Closed Access)
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SPS30000002185 TK7871.99.M44 M35 2009 raf Restricted and Confidential Materials Restricted & Confidential Master Thesis
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