Cover image for X-ray line profile analysis studies on SnSe thin films deposited at different substrate temperatures
Title:
X-ray line profile analysis studies on SnSe thin films deposited at different substrate temperatures
Personal Author:
General Note:
Thin solid films. 165 (1) : 257-263 ; 1988

Available:*

Library
Item Barcode
Call Number
Material Type
Item Category 1
Status
Searching...
30000001798341 MAK 6046 Open Access Book Article
Searching...

On Order