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3. 
Cover image for Material Engineering and Smart Materials: ICMESM 2016 : Selected, peer reviewed papers from the 2016 International Conference on Material Engineering and Smart Materials (ICMESM 2016), June 23-25, 2016, Singapore
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Cover image for Reflection high-energy electron diffraction
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Cover image for Third-generation and emerging solar-cell technologies : symposium held April 25-29, 2011, San Francisco, California, U.S.A.
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Cover image for Electronic thin film reliability
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Cover image for Sensors for chemical and biological applications
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Cover image for Fundamentals of nanoscale film analysis
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Cover image for Thin film analysis by x-ray scattering