Cover image for Ion beam surface layer analysis : proceedings
Title:
Ion beam surface layer analysis : proceedings
Conference Author:
International Conference on Ion Beam Surface Layer Analysis (1973 : Yorktown Heights, New York)
Publication Information:
Lausanne : Elsevier Sequoia, 1974
ISBN:
9780444195364
Subject Term:
Thin films -- Congresses
Added Author:
Mayer, James W., 1930-

Ziegler, James F.
Added Corporate Author:
United States. National Science Foundation

International Business Machines Corporation

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 30000001873094 QC176.82.I56 1973 Open Access Book Proceedings, Conference, Workshop etc.
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