Cover image for Three-dimensional x-ray diffraction microscopy : mapping polycrystals and their dynamics
Title:
Three-dimensional x-ray diffraction microscopy : mapping polycrystals and their dynamics
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Series:
Springer tracts in modern physics ; 205
Publication Information:
New York : Springer Verlag, 2004
ISBN:
9783540223306

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30000010107525 QC1 P68 2004 Open Access Book Book
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Summary

Summary

Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.

The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.


Table of Contents

Introduction
Methods for Meso-scale Structural Characterization
Geometric Principles
Graindex and Related Analysis
Orientation Mapping
Combining 3DXRD and Absorption Contrast Tomography
Multi-grain Crystallography
The 3DXRD Microscope
Applications
Alternative Approaches
Concluding Remarks