Title:
SAE residual stress measurement by X-Ray diffraction HS-784
Edition:
2003 ed.
Publication Information:
Warrendale : Society of Automotive Engineers Inc., 2003
Physical Description:
ix, 84 p. : ill. ; 28 cm.
ISBN:
9780768010695
9780768010961
Added Corporate Author:
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
---|---|---|---|---|---|
Searching... | 30000010167464 | TA407 S23 2003 | Open Access Book | Book | Searching... |
Searching... | 30000010167463 | TA407 S23 2003 | Open Access Book | Book | Searching... |