Cover image for SAE residual stress measurement by X-Ray diffraction HS-784
Title:
SAE residual stress measurement by X-Ray diffraction HS-784
Edition:
2003 ed.
Publication Information:
Warrendale : Society of Automotive Engineers Inc., 2003
Physical Description:
ix, 84 p. : ill. ; 28 cm.
ISBN:
9780768010695

9780768010961

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Item Category 1
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30000010167464 TA407 S23 2003 Open Access Book Book
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30000010167463 TA407 S23 2003 Open Access Book Book
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