Cover image for Thin film analysis by x-ray scattering
Title:
Thin film analysis by x-ray scattering
Personal Author:
Birkholz, Mario
Publication Information:
Weiheim : Wiley-VCH Verlag GmbH & Co. KGaA, 2006
ISBN:
9783527310524
Subject Term:
Thin films -- Analysis

Thin films -- Optical properties

X-rays -- Scattering

X-rays -- Diffraction
Added Author:
Fewster, Paul F

Genzel, Christoph

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 30000004702357 QC176.84.S93 B57 2006 Open Access Book Book
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