Cover image for SAE residual stress measurement by X-Ray diffraction HS-784
Title:
SAE residual stress measurement by X-Ray diffraction HS-784
Edition:
2003 ed.
Publication Information:
Warrendale : Society of Automotive Engineers Inc., 2003
Physical Description:
ix, 84 p. : ill. ; 28 cm.
ISBN:
9780768010695

9780768010961

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30000010167464 TA407 S23 2003 Open Access Book Book
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30000010167463 TA407 S23 2003 Open Access Book Book
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Summary

Summary

This editorial review of J784a is based upon decades of experience in the practical application of x-ray diffraction residual stress measurement methods in thousands of individual applications. J784 is a classic document. It serves as the only recognized standard for residual stress measurement available. The purpose of this revision is not to incorporate all of the research in the fields of x-ray and neutron diffraction but to focus on the practical applications of x-ray diffraction techniques useful to members of the automotive engineering related industries.