Compact multiport reflectometer for microwave material characterization

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xvi, 68 pages : illustrations (some colors) ; 27 cm

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Also available in CD-ROM : CP 084345 ra

Fulltext is available at http://dms.library.utm.my:8080

Supervisor : Dr. You Kok Yeow

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Thesis (Sarjana Kejuruteraan (Elektronik dan Telekomunikasi)) - Universiti Teknologi Malaysia, 2020

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