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1. 
Cover image for IEEE transactions on computer-aided design of integrated circuits and systems
2. 
Cover image for Microelectronics journal
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Cover image for Educational automatic test equipment (ATE) based on field programmable gate array (FPGA)
4. 
Cover image for Custom VLSI design of Kogge Stone Adder
5. 
Cover image for Educational automatic test equipment (ATE) based on field programmable gate array (FPGA)
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Cover image for Custom VLSI design of Kogge Stone Adder
7. 
Cover image for Device Electronics for Integrated Circuits
8. 
Cover image for A model-based testing framework for trusted platform module
9. 
Cover image for Digital integrated circuit design using verilog and systemverilog
10. 
Cover image for CMOS and beyond : logic switches for terascale integrated circuits
11. 
Cover image for A model-based testing framework for trusted platform modul
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Cover image for Package power delivery analysis for unmerged and merged power rails
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