Search Results for Metal oxide semiconductors

383 Results Found

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373.

MOS field-effect transistors and integrated circuits

Richman, Paul

Author

Richman, Paul

Format:

Call Number

TK7871.85 R53 1973

Publisher

John Wiley,

Publication Date

1973

ISBN

9780471720300

Available:
Holds:
Copies:

374.

MOS integrated circuits : theory, fabrication, design and systems applications of MOS LSI

Penny, William M

Author

Penny, William M, Lau, Lilian

Format:

Call Number

TK7871.85.M25 1972

Publisher

Van Nostrand Reinhold,

Publication Date

1972

ISBN

9780442203528

Available:
Holds:
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375.

II-IV compounds

Ray, Brian

Author

Ray, Brian

Format:

Call Number

QC611.R39 1969

Publisher

Pergamon Pr.,

Publication Date

1969

Available:
Holds:
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376.

Mosfet in circuit design : metal-oxide semiconductor field effect transistor for discrete and integrated-circuit technology

Crawford, Robert H.

Author

Crawford, Robert H.

Format:

Call Number

TK7871.95 C7 1967

Publisher

McGraw-Hill,

Publication Date

1967

ISBN

9780070134751

Available:
Holds:
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377.

Modelling of dopant diffusion in MOS fabrication process

Oommen P. A. Kunjappy

Author

Oommen P. A. Kunjappy

Format:

Call Number

TK7871.15.S55 O66 1990 raf

Project paper (Bachelor of Electrical Engineering)- Universiti Teknologi Malaysia, 1990

Available:
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378.

Deep submicron silicon on insulator (SOI) MOSFET

Vijay, K. Arora

Author

Vijay, K. Arora, Universiti Teknologi Malaysia. Fakulti Kejuruteraan Elektrik

Format:

Call Number

TK7871.85 V55 2008 af

ISBN

9789783540330

Available:
Holds:
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379.

CMOS integrated silicon pressure sensor

Tsutomu, Ishihara

Author

Tsutomu, Ishihara

Format:

Call Number

MAK 8412

Available:
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380.

Mosfet circuit debounces power relay

Venditti, Carlo

Author

Venditti, Carlo

Format:

Call Number

MAK 8730

Available:
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381.

CARRIER TRANSPORT IN NANOSCALE MOS TRANSISTORS

Tsuchiya, Hideaki, author

Author

Tsuchiya, Hideaki, author, Kamakura, Yoshinari, author

Format:

Call Number

TK7875 T78 2016

ISBN

9781118871669

Available:
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382.

Relliability behaviors of HCI and NBTI on 3-D planar mosfet and novel finfet

Rahimah Hassan, 1992-

Author

Rahimah Hassan, 1992-, Nurul Ezaila Alias, supervisor, Fakulti Kejuruteraan Elektrik

Format:

Call Number

TK7871.95 R34 2015 raf

Supervisor : Dr. Nurul Ezaila Alias

Available:
Holds:
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383.

Relliability behaviors of HCI and NBTI on 3-D planar mosfet and novel finfet

Rahimah Hassan, 1992-

Author

Rahimah Hassan, 1992-

Format:

Call Number

CP 059985 ra

Supervisor : Dr. Nurul Ezaila Alias

Available:
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