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14. 
Cover image for Trace-based post-silicon validation for VLSI circuits
16. 
Cover image for Bio/CMOS interfaces and co-design
18. 
Cover image for Fundamentals of ultra-thin-body MOSFETs and FinFETs
23. 
Cover image for Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A.