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Zavalij, Peter Y.
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Fakulti Kejuruteraan Kimia dan Kejuruteraan Sumber Asli
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X-rays -- Diffraction
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13. 
Cover image for X-ray diffraction by polycrystalline materials
14. 
Cover image for Collection of simulated XRD powder patterns for zeolites
15. 
Cover image for X-ray metrology in semiconductor manufacturing
16. 
Cover image for Powder diffraction : the rietveld method and the two stage method to determine and refine crystal structures from powder diffraction data
17. 
Cover image for Thin film analysis by x-ray scattering
18. 
Cover image for Coherent x-ray optics
19. 
Cover image for X-ray diffraction studies on silicon nanostructure thin films : (review paper)
20. 
Cover image for Industrial applications of X-ray diffraction
21. 
Cover image for Three-dimensional x-ray diffraction microscopy : mapping polycrystals and their dynamics
22. 
Cover image for Rietveld refinement for Zeolite A and Ferrierite
23. 
Cover image for Rietveld refinement for Zeolite A and Ferrierite
24. 
Cover image for XRD diffractogram simulation and refinement using rietveld method for zeolite-p structure identification
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