Search Results for - Narrowed by: Semiconductors - Ong, Hui Yien, 1980-SirsiDynix Enterprisehttp://portal.utm.my/client/en_AU/main/main/qf$003dSUBJECT$002509Subject$002509Semiconductors$002509Semiconductors$0026qf$003dAUTHOR$002509Author$002509Ong$00252C$002bHui$002bYien$00252C$002b1980-$002509Ong$00252C$002bHui$002bYien$00252C$002b1980-$0026ps$003d300?dt=list2024-04-30T11:10:31ZFunctional test generation using micro operation fault modelent://SD_ILS/0/SD_ILS:7975762024-04-30T11:10:31Z2024-04-30T11:10:31Zby Ong, Hui Yien, 1980-<br/>Author Ong, Hui Yien, 1980-, Ooi, Chia Yee, Fakulti Kejuruteraan Elektrik<br/>Format: Books<br/>Call Number TK7874 O64 2011 raf<br/>Publication Date 2011<br/>Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2011<br/>Functional test generation using micro operation fault modelent://SD_ILS/0/SD_ILS:7977922024-04-30T11:10:31Z2024-04-30T11:10:31Zby Ong, Hui Yien, 1980-<br/>Author Ong, Hui Yien, 1980-<br/>Format: Books<br/>Call Number CP 030161 ra<br/>Publication Date 2011<br/>Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2011<br/>