Search Results for - Narrowed by: Semiconductors - Ong, Hui Yien, 1980- SirsiDynix Enterprise http://portal.utm.my/client/en_AU/main/main/qf$003dSUBJECT$002509Subject$002509Semiconductors$002509Semiconductors$0026qf$003dAUTHOR$002509Author$002509Ong$00252C$002bHui$002bYien$00252C$002b1980-$002509Ong$00252C$002bHui$002bYien$00252C$002b1980-$0026ps$003d300?dt=list 2024-04-30T11:10:31Z Functional test generation using micro operation fault model ent://SD_ILS/0/SD_ILS:797576 2024-04-30T11:10:31Z 2024-04-30T11:10:31Z by&#160;Ong, Hui Yien, 1980-<br/>Author&#160;Ong, Hui Yien, 1980-,&#160;Ooi, Chia Yee,&#160;Fakulti Kejuruteraan Elektrik<br/>Format:&#160;Books<br/>Call Number&#160;TK7874 O64 2011 raf<br/>Publication Date&#160;2011<br/>Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2011<br/> Functional test generation using micro operation fault model ent://SD_ILS/0/SD_ILS:797792 2024-04-30T11:10:31Z 2024-04-30T11:10:31Z by&#160;Ong, Hui Yien, 1980-<br/>Author&#160;Ong, Hui Yien, 1980-<br/>Format:&#160;Books<br/>Call Number&#160;CP 030161 ra<br/>Publication Date&#160;2011<br/>Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2011<br/>