Search Results for Failure time data analysis - Narrowed by: Reliability (Engineering) -- Statistical methods SirsiDynix Enterprise http://portal.utm.my/client/en_AU/main/main/qu$003dFailure$002btime$002bdata$002banalysis$0026qf$003dSUBJECT$002509Subject$002509Reliability$002b$002528Engineering$002529$002b--$002bStatistical$002bmethods$002509Reliability$002b$002528Engineering$002529$002b--$002bStatistical$002bmethods$0026ic$003dtrue$0026ps$003d300?dt=list 2024-04-30T17:50:30Z Reliability analysis and prediction with warranty data : issues, strategies, and methods ent://SD_ILS/0/SD_ILS:316422 2024-04-30T17:50:30Z 2024-04-30T17:50:30Z by&#160;Rai, Bharatendra K.<br/>Author&#160;Rai, Bharatendra K.,&#160;Singh, Nanua<br/>Format:&#160;Books<br/>Call Number&#160;TA169 R34 2009<br/>Publisher&#160;CRC Press,<br/>Publication Date&#160;2009<br/>ISBN&#160;9781439803257<br/> Accelerated testing : statistical models, test plans, and data analysis ent://SD_ILS/0/SD_ILS:425058 2024-04-30T17:50:30Z 2024-04-30T17:50:30Z by&#160;Nelson, Wayne<br/>Author&#160;Nelson, Wayne<br/>Format:&#160;Books<br/>Call Number&#160;QA276 N45 2004<br/>Publisher&#160;Wiley-Interscience,<br/>Publication Date&#160;2004<br/>ISBN&#160;9780471697367<br/> Accelerated testing : statistical models, test plans, and data analyses ent://SD_ILS/0/SD_ILS:113281 2024-04-30T17:50:30Z 2024-04-30T17:50:30Z by&#160;Nelson, Wayne, 1936-<br/>Author&#160;Nelson, Wayne, 1936-<br/>Format:&#160;Books<br/>Call Number&#160;QA276 N45 1990<br/>Publisher&#160;John Wiley &amp; Sons,<br/>Publication Date&#160;1990<br/>ISBN&#160;9780471522775<br/>