Search Results for Linear integrated circuits -- TestingSirsiDynix Enterprisehttp://portal.utm.my/client/en_AU/main/main/qu$003dLinear$002bintegrated$002bcircuits$002b--$002bTesting$0026ic$003dtrue$0026ps$003d300?dt=list2024-07-02T04:33:37ZDesign of enhanced non exclusive XOR test of 2-D linear feedback shift registerent://SD_ILS/0/SD_ILS:7700172024-07-02T04:33:37Z2024-07-02T04:33:37Zby Wong, Shin Guey, 1981-<br/>Author Wong, Shin Guey, 1981-, Ooi, Chia Yee, Fakulti Kejuruteraan Elektrik<br/>Format: Books<br/>Call Number TK7874 W65 2010 raf<br/>Publication Date 2010<br/>Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2010<br/>Design of enhanced non exclusive XOR test of 2-D linear feedback shift registerent://SD_ILS/0/SD_ILS:7700192024-07-02T04:33:37Z2024-07-02T04:33:37Zby Wong, Shin Guey, 1981-<br/>Author Wong, Shin Guey, 1981-<br/>Format: Books<br/>Call Number CP 025190 ra<br/>Publication Date 2010<br/>Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2010<br/>Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approachent://SD_ILS/0/SD_ILS:2819872024-07-02T04:33:37Z2024-07-02T04:33:37Zby Sun, Yichuang<br/>Author Sun, Yichuang, Institution of Engineering and Technology<br/>Format: Books<br/>Call Number TK7874.654 T47 2008<br/>Publisher IET,<br/>Publication Date 2008<br/>ISBN 9780863417450<br/>Fault diagnosis of analog integrated circuitsent://SD_ILS/0/SD_ILS:4639912024-07-02T04:33:37Z2024-07-02T04:33:37Zby Kabisatpathy, Prithviraj<br/>Author Kabisatpathy, Prithviraj, Barua, Alok, Sinha, Satyabroto<br/>Format: Books<br/>Call Number TK7874.654 K32 2005<br/>Publisher Springer,<br/>Publication Date 2005<br/>ISBN 9780387257426<br/>Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuitsent://SD_ILS/0/SD_ILS:4184732024-07-02T04:33:37Z2024-07-02T04:33:37Zby Abu Khairi A'ain<br/>Author Abu Khairi A'ain<br/>Format: Books<br/>Call Number TK7874.6.A28 1996 raf<br/>Publisher University of Lancaster,<br/>Publication Date 1996<br/>Thesis (PhD) - University of Lancaster, 1996<br/>Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits; Telechelic natural rubber oligomers via controlled ozonolysis; Symbolic manipulations related to certain aspects such interpretations of graphs; A study of vibrational power flow in fibre-reinforced plastic material; Ultrasound fields in crossflow microfiltrationent://SD_ILS/0/SD_ILS:213172024-07-02T04:33:37Z2024-07-02T04:33:37Zby Abu Khairi A'ain<br/>Author Abu Khairi A'ain, Hussin Mohd. Nor, Maselan Ali, Roslan Abdul Rahman, Rosli Mohd. Yunus<br/>Format: Visual Materials<br/>Call Number MFL 8758 ra<br/>Publisher UTM,<br/>Publication Date 1996<br/>Thesis (Phd) - University of Lancaster, 1996<br/>Testing analogue circuits by power supply voltage control testing technique : an analysis at bias pointent://SD_ILS/0/SD_ILS:4609372024-07-02T04:33:37Z2024-07-02T04:33:37Zby Abu Khairi A'ain<br/>Author Abu Khairi A'ain<br/>Format: Books<br/>Memory LSI, linear IC : digest of papersent://SD_ILS/0/SD_ILS:4655892024-07-02T04:33:37Z2024-07-02T04:33:37Zby Semiconductor Test Symposium (6th : 1975 : NJ)<br/>Author Semiconductor Test Symposium (6th : 1975 : NJ), Institute of Electrical and Electronics Engineers<br/>Format: Books<br/>Call Number TK7895.M4S44 1975 f<br/>