Search Results for Thin films -- Analysis - Narrowed by: Open Access BookSirsiDynix Enterprisehttp://portal.utm.my/client/en_AU/main/main/qu$003dThin$002bfilms$002b--$002bAnalysis$0026qf$003dITYPE$002509Material$002bType$0025091$00253AOPEN_BK$002509Open$002bAccess$002bBook$0026ps$003d300?dt=list2024-06-19T11:57:27ZPhysical emasurement and analysis of thin filmsent://SD_ILS/0/SD_ILS:1816702024-06-19T11:57:27Z2024-06-19T11:57:27Zby Murt, E. M.<br/>Author Murt, E. M.<br/>Format: Books<br/>Call Number QD71.P76 1969<br/>Publisher Plenum Pr.,<br/>Publication Date 1969<br/>X-ray line profile analysis studies on SnSe thin films deposited at different substrate temperaturesent://SD_ILS/0/SD_ILS:3164672024-06-19T11:57:27Z2024-06-19T11:57:27Zby Rao, T. Subba<br/>Author Rao, T. Subba, Samantaray, B. K., Chaudhuri, A. K.<br/>Format: Books<br/>Call Number MAK 6046<br/>Material Engineering and Smart Materials: ICMESM 2016 : Selected, peer reviewed papers from the 2016 International Conference on Material Engineering and Smart Materials (ICMESM 2016), June 23-25, 2016, Singaporeent://SD_ILS/0/SD_ILS:8731242024-06-19T11:57:27Z2024-06-19T11:57:27Zby International Conference on Material Engineering and Smart Materials (2016 : Singapore)<br/>Author International Conference on Material Engineering and Smart Materials (2016 : Singapore), Saadah Abdul Rahman, editor, Gong, Hao, editor, Li, Kai, editor, Gupta, K. M., editor<br/>Format: Books<br/>Call Number TA401.3 I5849 2017<br/>Publication Date 2017<br/>ISBN 9783038357360<br/>Reflection high-energy electron diffractionent://SD_ILS/0/SD_ILS:7669052024-06-19T11:57:27Z2024-06-19T11:57:27Zby Ichimiya, Ayahiko, 1940-<br/>Author Ichimiya, Ayahiko, 1940-, Cohen, Philip I<br/>Format: Books<br/>Call Number QC176.84.S93 I24 2004<br/>Publisher Cambridge University Press,<br/>Publication Date 2011 2004<br/>ISBN 9780521184021<br/>Third-generation and emerging solar-cell technologies : symposium held April 25-29, 2011, San Francisco, California, U.S.A.ent://SD_ILS/0/SD_ILS:8098322024-06-19T11:57:27Z2024-06-19T11:57:27Zby Symposium B, "Third-Generation and Emerging Solar-Cell Technologies" (2011 : San Francisco, Calif.)<br/>Author Symposium B, "Third-Generation and Emerging Solar-Cell Technologies" (2011 : San Francisco, Calif.), Lu, Yalin., Materials Research Society. Meeting (2011 : San Francisco, Calif.)<br/>Format: Books<br/>Call Number TK2960 S938 2011<br/>Publisher Materials Research Society ; Cambridge University Press,<br/>Publication Date 2011<br/>ISBN 9781605112992<br/>Electronic thin film reliabilityent://SD_ILS/0/SD_ILS:7668932024-06-19T11:57:27Z2024-06-19T11:57:27Zby Tu, K. N. (King-ning), 1937-<br/>Author Tu, K. N. (King-ning), 1937-<br/>Format: Books<br/>Call Number TA418.9.T45 T85 2010<br/>Publisher Cambridge University Press,<br/>Publication Date 2010<br/>ISBN 9780521516136<br/>Sensors for chemical and biological applicationsent://SD_ILS/0/SD_ILS:6394532024-06-19T11:57:27Z2024-06-19T11:57:27Zby Ram, Manoj Kumar<br/>Author Ram, Manoj Kumar, Bhethanabotla, Venkat R.<br/>Format: Books<br/>Call Number R857.B54 S46 2010<br/>Publisher Taylor & Francis,<br/>Publication Date 2010<br/>ISBN 9780849333668<br/>Fundamentals of nanoscale film analysisent://SD_ILS/0/SD_ILS:1414852024-06-19T11:57:27Z2024-06-19T11:57:27Zby Alford, Terry L.<br/>Author Alford, Terry L., Feldman, Leonard C., Mayer, James W., 1930-<br/>Format: Books<br/>Call Number QC176.83 A43 2007<br/>Publisher Springer,<br/>Publication Date 2007<br/>ISBN 9780387292601<br/><a href="http://dx.doi.org/10.1007/978-0-387-29261-8">Fulltext</a><br/>Thin film analysis by x-ray scatteringent://SD_ILS/0/SD_ILS:4591962024-06-19T11:57:27Z2024-06-19T11:57:27Zby Birkholz, Mario<br/>Author Birkholz, Mario, Fewster, Paul F, Genzel, Christoph<br/>Format: Books<br/>Call Number QC176.84.S93 B57 2006<br/>Publisher Wiley-VCH Verlag GmbH & Co. KGaA,<br/>Publication Date 2006<br/>ISBN 9783527310524<br/>Photooxidation of chlorinated hydrocarbon using TIO2 thin filment://SD_ILS/0/SD_ILS:3951132024-06-19T11:57:27Z2024-06-19T11:57:27Zby Ng, Sook Chuin<br/>Author Ng, Sook Chuin, Mohd. Yusuf Othman, Wan Azelee Wan Abu Bakar, Noor Khaida Wati Mohd. Saiyudi, Simposium Kimia Analisis Malaysia (ke-17 : 2004 : Kuantan, Pahang)<br/>Format: Books<br/>Call Number QD716.P45 P464 2004<br/>Publisher Universiti Teknologi Malaysia,<br/>Publication Date 2004<br/>Reflection high-energy electron diffractionent://SD_ILS/0/SD_ILS:4372462024-06-19T11:57:27Z2024-06-19T11:57:27Zby Ichimiya, Ayahiko, 1940-<br/>Author Ichimiya, Ayahiko, 1940-, Cohen, Philip I.<br/>Format: Books<br/>Call Number QC176.84.S93 I23 2004<br/>Publisher Cambridge University Press,<br/>Publication Date 2004<br/>ISBN 9780521453738<br/>Correlation spectroscopy of surfaces, thin films, and nanostructuresent://SD_ILS/0/SD_ILS:4013902024-06-19T11:57:27Z2024-06-19T11:57:27Zby Berakdar, J., 1964-<br/>Author Berakdar, J., 1964-, Kirschner, J. (J�urgen), 1945-<br/>Format: Books<br/>Call Number QC173.4.S94 C67 2004<br/>Publisher Wiley-VCH,<br/>Publication Date 2004<br/>ISBN 9783527404773<br/>The Effect of curing temperature and concentration of monomer on performance of the thin film compposite using cellulose acetate as support membraneent://SD_ILS/0/SD_ILS:3911832024-06-19T11:57:27Z2024-06-19T11:57:27Zby Faridah Kormin<br/>Author Faridah Kormin, Ani Idris, International Conference and Exhibition on Macromolecular Science and Its Impact on Industries (2004 : Kuala Lumpur)<br/>Format: Books<br/>Call Number QC176.82 F37 2004<br/>Publisher Universiti Teknologi Malaysia,<br/>Publication Date 2004<br/>Surface and thin film analysis : principles, instrumentation, applicationsent://SD_ILS/0/SD_ILS:4236722024-06-19T11:57:27Z2024-06-19T11:57:27Zby Bubert, H. (Henning)<br/>Author Bubert, H. (Henning), Jenett, H. (Holger)<br/>Format: Books<br/>Call Number QC176.84.S93 S97 2002<br/>Publisher John Wiley and Sons,<br/>Publication Date 2002<br/>ISBN 9783527304585<br/>Ion implantation and ion beam analysis techniques in corrosion studiesent://SD_ILS/0/SD_ILS:2001682024-06-19T11:57:27Z2024-06-19T11:57:27Zby Conference on Ion Implantation and Ion Beam Analysis Techniques in Corrosion Studies (1975: Manchester)<br/>Author Conference on Ion Implantation and Ion Beam Analysis Techniques in Corrosion Studies (1975: Manchester)<br/>Format: Books<br/>Call Number QC702.7.I55 C65 1975<br/>Publisher Pergamon,<br/>Publication Date 1976<br/>ISBN 008021420<br/>Ion beam surface layer analysis : proceedingsent://SD_ILS/0/SD_ILS:2021472024-06-19T11:57:27Z2024-06-19T11:57:27Zby International Conference on Ion Beam Surface Layer Analysis (1973 : Yorktown Heights, New York)<br/>Author International Conference on Ion Beam Surface Layer Analysis (1973 : Yorktown Heights, New York), Mayer, James W., 1930-, Ziegler, James F., United States. National Science Foundation, International Business Machines Corporation<br/>Format: Books<br/>Call Number QC176.82.I56 1973<br/>Publisher Elsevier Sequoia,<br/>Publication Date 1974<br/>ISBN 9780444195364<br/>An analysis of the characteristics of insulated-gate thin-film transistorsent://SD_ILS/0/SD_ILS:1095532024-06-19T11:57:27Z2024-06-19T11:57:27Zby Borkan, Harold<br/>Author Borkan, Harold, Weimer, Paul K.<br/>Format: Books<br/>Call Number MAK 12526<br/>Kajian analisis pembelauan sinar-X dan kesan perubahan suhu terhadap kekonduksian elektrik saput tipis CuInS2ent://SD_ILS/0/SD_ILS:3902862024-06-19T11:57:27Z2024-06-19T11:57:27Zby Yussof Wahab<br/>Author Yussof Wahab, Seminar Penyelidikan dan Pengajian Siswazah (1995 : Skudai)<br/>Format: Books<br/>Call Number MAK 11273 a<br/>An analysis of the characteristics of insulated-gate thin-film transistorsent://SD_ILS/0/SD_ILS:2853272024-06-19T11:57:27Z2024-06-19T11:57:27Zby Borkan, Harold<br/>Author Borkan, Harold, Weimer, Paul K.<br/>Format: Books<br/>Call Number MAK 9137<br/>Materials and Technologies in Modern Industrial Production : Selected, peer reviewed papers from the International Conference on Nanotechnology and Nanomaterials in Energy, June 2-4, 2016, Paris, Franceent://SD_ILS/0/SD_ILS:8734032024-06-19T11:57:27Z2024-06-19T11:57:27Zby International Conference on Nanotechnology and Nanomaterials in Energy 2016 : Paris, France<br/>Author International Conference on Nanotechnology and Nanomaterials in Energy 2016 : Paris, France, Ruijia, Shi, author, Delaunay, Jean-Jacques, author<br/>Format: Books<br/>Call Number TS176 I583 2017<br/>ISBN 9783035710168<br/>