Title:
Laser cleaning : optical physics, applied physics and materials science
Publication Information:
River Edge, N.J. : World Scientific, 2002
ISBN:
9789810249410
Added Author:
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
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Searching... | 30000010026045 | TA1675 L374 2002 | Open Access Book | Book | Searching... |
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Summary
Summary
Presents the mechanics of the cleaning processes, experimental results, and different applications, including laser cleaning of art.
Table of Contents
Preface | p. 1 |
Part 1. History | |
Chapter 1. The Road to "Steam Laser Cleaning" | p. 23 |
1. Meeting Andrew C. Tam | p. 23 |
2. A cleaning method needed | p. 24 |
3. 'Laser cleaning' | p. 26 |
4. 'Steam laser cleaning' | p. 29 |
5. Steam laser cleaning with short-pulse IR-lasers | p. 33 |
6. Steam laser cleaning: direct imaging of the jet motion | p. 34 |
7. Opto-acoustic detection of the liquid film explosion | p. 40 |
8. Steam laser cleaning: study of the mechanism of the liquid film explosion | p. 41 |
9. Stencil masks again | p. 45 |
Acknowledgement | p. 46 |
Thanks to Andrew C. Tam | p. 46 |
References | p. 46 |
Part 2. Dry Laser Cleaning | |
Chapter 2. Dry Laser Cleaning of Particles by Nanosecond Pulses: Theory | p. 51 |
1. Introduction | p. 51 |
2. Adhesion potential and equation of motion | p. 53 |
2.1. Model expression for elastic-VdW potential | p. 53 |
2.2. Parabolic approximation | p. 57 |
2.3. Equation for the evolution of deformation h | p. 58 |
2.4. Damping coefficient | p. 59 |
2.4.1. Knudsen viscosity | p. 59 |
2.4.2. Stokes viscosity | p. 59 |
2.4.3. Absorption of sound | p. 60 |
2.4.4. Emission of sound | p. 61 |
2.4.5. Plastic deformation | p. 61 |
3. Thermal expansion | p. 62 |
3.1. Hierarchy of scales | p. 62 |
3.2. General equations | p. 63 |
3.3. Unilateral quasi-static expansion | p. 65 |
3.4. 3D quasi-static expansion for finite beams with 1D heat conduction | p. 67 |
3.4.1. Comparison between different approximations | p. 68 |
3.5. Particle influence on the expansion of the substrate | p. 69 |
3.6. Unilateral dynamic expansion | p. 70 |
3.7. Thermal expansion of absorbing particle | p. 71 |
3.8. Transparent particle heated by the substrate | p. 72 |
3.9. Maximum energy of ejected particles | p. 72 |
4. Cleaning threshold | p. 73 |
4.1. General threshold conditions | p. 73 |
4.1.1. Short cleaning pulse | p. 74 |
4.1.2. Long cleaning pulse | p. 74 |
4.1.3. Over-damped movement | p. 75 |
4.1.4. Long pulses with steep fronts | p. 75 |
4.2. Single sinusoidal pulse in parabolic potential without damping | p. 76 |
4.3. Dependence of cleaning threshold on particle radius and pulse duration | p. 78 |
5. SiO[subscript 2] particles cleaned from Si wafers | p. 82 |
5.1. Experimental | p. 82 |
5.2. Cleaning threshold vs. radius | p. 83 |
5.3. Role of small oscillations in intensity | p. 86 |
5.4. Suggestions for cleaning experiments | p. 87 |
6. Conclusions | p. 89 |
Acknowledgements | p. 90 |
Appendix A. Quasi-static 3D thermal expansion | p. 90 |
Appendix B. Cleaning threshold with the single sinusoidal pulse | p. 95 |
References | p. 96 |
Chapter 3. Optical Resonance and Near-Field Effects in Dry Laser Cleaning | p. 103 |
1. Introduction | p. 103 |
2. Optical resonance and near-field effects within the Mie theory | p. 106 |
3. Particle on the surface. Beyond the Mie theory | p. 117 |
4. Adhesion potential and Hamaker-Lifshitz constant | p. 128 |
5. Temperature under the particle | p. 138 |
6. Dynamics of the particle, 3D effects | p. 144 |
7. Comparison with experimental results | p. 155 |
7.1. Local substrate ablation--a probe for optical near-fields | p. 155 |
7.1.1. Morphology of near field-induced damage sites | p. 156 |
7.1.2. Parameters influencing field enhancement induced ablation | p. 159 |
7.2. Near field effects in the laser cleaning process | p. 162 |
7.2.1. Experimental details | p. 162 |
7.2.2. Variation of the size parameter | p. 163 |
7.2.2.1. Variation of the particle size | p. 164 |
7.2.2.2. Variation of the laser wavelength | p. 167 |
7.2.3. Influence of incident angle | p. 168 |
7.2.4. Influence of surface roughness | p. 169 |
8. Conclusion | p. 170 |
Acknowledgements | p. 172 |
References | p. 172 |
Part 3. Steam Laser Cleaning | |
Chapter 4. Pulsed laser cleaning of particles from surfaces and optical materials | p. 181 |
1. Introduction | p. 181 |
2. Review tables of experimental pulsed laser cleaning of contaminants (mostly particles) from surfaces | p. 185 |
2.1. Overview of the information in the tables | p. 185 |
2.2. Silicon-wafers, hydrophilic and membrane masks | p. 190 |
2.3. Glass and related optical surfaces | p. 196 |
2.4. Other material surfaces | p. 198 |
3. Experimental studies of laser cleaning particles from glass at Macquarie University | p. 198 |
3.1. Single pulse laser cleaning studies | p. 198 |
3.1.1. "Dip and tap" sample preparation | p. 198 |
3.1.2. Dry/Damp laser cleaning | p. 199 |
3.1.3. Before and after images--microscope slides and fused silica | p. 211 |
3.2. Cleaning efficiency measured from optical microscopy images | p. 214 |
3.2.1. Particle de-agglomeration and removal | p. 214 |
3.2.2. Laser cleaning efficiency as a function of pulse fluence | p. 218 |
3.2.3. Laser cleaning threshold fluence measurement | p. 220 |
4. Concluding remarks | p. 222 |
Acknowledgments | p. 223 |
References | p. 223 |
Chapter 5. Liquid-Assisted Pulsed Laser Cleaning with Near Infrared and Ultraviolet-Pulsed Lasers | p. 229 |
1. Introduction | p. 229 |
2. Experiments | p. 232 |
2.1. Laser cleaning system and optical diagnostics | p. 232 |
2.2. Operation parameters and experimental procedures | p. 236 |
3. Experimental results | p. 236 |
3.1. Excimer laser cleaning | p. 236 |
3.2. Nd: YAG laser cleaning | p. 237 |
3.3. Summary of cleaning results | p. 240 |
4. Physical mechanisms | p. 241 |
4.1. In-situ monitoring of reflectance and visualization | p. 241 |
4.2. Temperature, pressure, and bubble dynamics | p. 242 |
5. Conclusion | p. 252 |
Acknowledgments | p. 252 |
References | p. 252 |
Chapter 6. Steam Laser Cleaning of Silicon Wafers: Laser Induced Bubble Nucleation and Efficiency Measurements | p. 255 |
1. Introduction | p. 256 |
2. Experimental | p. 257 |
2.1. Sample preparation | p. 258 |
2.2. Laser sources | p. 259 |
2.3. Surface plasmon probe and optical reflectance probe | p. 260 |
2.4. Scattered light probe | p. 262 |
2.5. Evaluation of the cleaning efficiency | p. 262 |
2.6. Determination of laser fluence | p. 263 |
3. Laser induced bubble nucleation and pressure generation | p. 264 |
3.1. Theoretical background | p. 265 |
3.1.1. Kinetic limit of superheating | p. 265 |
3.1.2. Nucleation theory | p. 267 |
3.2. Experiments on metal films | p. 272 |
3.2.1. Detection of bubble nucleation via SPP | p. 272 |
3.3. Bubble nucleation on silicon wafers | p. 282 |
3.3.1. Water at smooth silicon wafers | p. 283 |
3.3.2. Water at structured silicon substrates | p. 289 |
3.3.3. IPA on smooth silicon wafers | p. 292 |
3.4. Heat transfer coefficient | p. 292 |
4. Removal of particles on surfaces via laser induced bubble nucleation: steam laser cleaning | p. 294 |
4.1. Efficiency measurements | p. 296 |
4.1.1. Dependence on the number of applied laser pulses | p. 296 |
4.1.2. Dependence on the laser fluence and variation on the particle size | p. 298 |
4.2. Discussion and concluding remarks | p. 300 |
Acknowledgments | p. 304 |
References | p. 305 |
Chapter 7. Physical Mechanisms of Laser Cleaning | p. 311 |
1. Introduction | p. 311 |
2. Laser cleaning of the solid surface from particles | p. 312 |
2.1. Dry laser cleaning | p. 313 |
2.1.1. The cleaning force | p. 313 |
2.1.2. Surface cleaning condition | p. 316 |
2.1.3. Dry laser cleaning in the multipulse regime | p. 316 |
2.1.4. Discussion | p. 318 |
2.2. Steam laser cleaning | p. 319 |
2.2.1. Absorbing particles at the transparent substrate | p. 319 |
2.2.2. Transparent particles at the absorbing substrate | p. 321 |
2.2.3. Absorbing particles at the absorbing substrate | p. 326 |
2.2.4. Discussion | p. 327 |
3. Laser cleaning of the solid surface from films | p. 327 |
3.1. Laser cleaning by buckling mechanism | p. 328 |
3.1.1. The main regularities and regimes of film buckling | p. 329 |
3.1.2. Film ablation without melting before separation of the film fragment | p. 331 |
3.1.3. Ablation of the melting film | p. 331 |
3.1.4. Film degradation | p. 334 |
3.2. Laser cleaning by film shaking-off | p. 337 |
3.3. The conditions of action of shaking-off and buckling mechanisms of film ablation | p. 337 |
3.4. Other mechanisms of laser cleaning of solid surfaces from films | p. 338 |
4. Conclusion | p. 339 |
Acknowledgments | p. 340 |
References | p. 340 |
Part 4. Laser Cleaning of Artworks | |
Chapter 8. Laser Ablation in Cleaning of Artworks | p. 343 |
1. Introduction | p. 343 |
2. Laser ablation of complex polymerized materials | p. 344 |
2.1. Optimization of laser parameters | p. 344 |
2.1.1. Ablation efficiency studies | p. 346 |
2.1.2. Light transmission studies | p. 353 |
2.1.3. Chemical alteration of substrate | p. 355 |
2.2. Laser-assisted removal of aged varnish from paintings | p. 358 |
2.3. Laser-assisted removal of paint from composite materials | p. 365 |
3. Laser divestment of encrustation | p. 370 |
3.1. Major operative mechanisms and associated optical phenomena | p. 370 |
3.2. Removal of encrustation--test case studies | p. 380 |
4. Conclusions | p. 384 |
Acknowledgments | p. 385 |
References | p. 385 |
Chapter 9. On the Theory of Discoloration Effect in Pigments at Laser Cleaning | p. 393 |
1. Introduction | p. 393 |
2. The thermal ablation model | p. 395 |
3. Method of moments | p. 398 |
4. Thermal field within the ablated material. Numerical results | p. 402 |
5. Kinetics of phase transition and surface modification | p. 405 |
Acknowledgments | p. 411 |
References | p. 411 |
Part 5. Applications of Laser Cleaning | |
Chapter 10. Cleaning for Field Emitter Arrays | p. 417 |
1. Introduction | p. 417 |
2. Experimental procedures | p. 419 |
3. Laser light irradiation | p. 420 |
3.1. Laser irradiation modes | p. 420 |
3.1.1. Laser irradiation without field emission | p. 420 |
3.1.2. Laser irradiation with field emission | p. 422 |
3.2. IR and visible laser light ([lambda] = 1047 and 523.5 nm) irradiation | p. 422 |
3.3. UV laser light ([lambda] = 349 nm) irradiation | p. 422 |
3.4. UV laser light ([lambda] = 262 nm) irradiation | p. 429 |
4. Conclusions | p. 430 |
Acknowledgments | p. 431 |
References | p. 431 |
Chapter 11. Laser Cleaning of Organic Contamination on Microelectronic Devices and Process Real-Time Monitoring | p. 433 |
1. Introduction | p. 436 |
2. Experimental setup | p. 438 |
3. Results and discussion | p. 438 |
3.1. Laser cleaning of flexible circuit for inkjet printer cartridge | p. 438 |
3.2. Laser deflashing of IC packages | p. 441 |
3.3. Signal generation and diagnostics during the laser cleaning | p. 448 |
3.3.1. Audible acoustic wave generation | p. 451 |
3.3.2. Diagnostics of plasma-induced electric field | p. 456 |
3.3.3. Detection of plasma optical signal | p. 457 |
4. Conclusions | p. 460 |
Acknowledgments | p. 461 |
References | p. 461 |
Subject Index | p. 465 |