Title:
Modified pattern generator of built-in self test for sequential circuits with reduced test time
Personal Author:
Publication Information:
2011
Physical Description:
xvi, 95 p. : ill. ; 30 cm.
General Note:
Also available in CD-ROM : CP 024992 ra
Supervisor : Prof. Dr. Abu Khari A'ain
Added Author:
Added Corporate Author:
DSP_DISSERTATION:
Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2011
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
|---|---|---|---|---|---|
Searching... | FKE30000004127 | TK7874.75 M75 2011 raf | Closed Access Thesis | UTM Master Thesis (Closed Access) | Searching... |
Searching... | 30000010264868 | TK7874.75 M75 2011 raf | Closed Access Thesis | UTM Master Thesis (Closed Access) | Searching... |
Searching... | SPS30000002877 | TK7874.75 M75 2011 raf | Closed Access Thesis | UTM Master Thesis (Closed Access) | Searching... |
