Cover image for Modified pattern generator of built-in self test for sequential circuits with reduced test time
Title:
Modified pattern generator of built-in self test for sequential circuits with reduced test time
Publication Information:
2011
Physical Description:
1 CD-ROM ; 12 cm.
General Note:
Also available in printed version : TK7874.75 M75 2011 raf

Supervisor : Prof. Dr. Abu Khari A'ain
DSP_DISSERTATION:
Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2011

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FKE30000006368 CP 024992 ra UTM Special Collection - Computer File Compact Disc Accompanies UTM Thesis/Project Paper
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30000010264869 CP 024992 ra UTM Special Collection - Computer File Compact Disc Accompanies UTM Thesis/Project Paper
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