Design and test techniques for VLSI and WSI circuits

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Title:

Design and test techniques for VLSI and WSI circuits

Publication Information:

London : Peter Peregrinus, 1989

ISBN:

9780863411656

Subject Term:

Integrated circuits -- Very large scale integration -- Design and construction

Integrated circuits -- Wafer-scale integration -- Design and construction

Integrated circuits -- Very large scale integration -- Testing

Added Author:

Available:*

Library	Item Barcode	Call Number	Material Type	Item Category 1	Status
Searching... PSZ JB	30000001265523	TK7874.D474 1989	Open Access Book	Book	Searching... Unknown

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