VLSI test principles and architectures : design for testability

Select an Action

Title:

Series:

The Morgan Kaufmann series in systems on silicon

Publication Information:

Amsterdam : Morgan Kaufmann, 2006

Physical Description:

xxx, 777 p. : ill. ; 25 cm.

ISBN:

9780123705976

Subject Term:

Added Author:

Library	Item Barcode	Call Number	Material Type	Item Category 1	Status
Searching... PSZ JB	30000010178270	TK7874.75 V47 2006	Open Access Book	Book	Searching... Unknown